Crystal size | ~10 mm |
Electrical properties | Semiconductor, p-type (we also have n-type available) |
Crystal structure | hexagonal |
Unit cell parameters | a = b = 0.328 nm, c = 1.298 nm, α = β = 90°, γ = 120° |
Type | Synthetic |
Purity | >99.995 % |
Characterized by | XRD, Raman, EDX, Hall measurement |
More information? | Please contact us by email or phone |
XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Energy-dispersive X-ray spectroscopy for stoichiometric analysis
Raman: 785 nm Raman system
Hall measurement: Extraction of charge carrier density and doping in the Van der Pauw geometry.
Click on an image to zoom
X-ray diffraction on a WSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10
Powder X-ray diffraction (XRD) of a single crystal WSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal WSe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal WSe2. Measurement was performed with a 785 nm Raman system at room temperature.
1. H.C.P. Movva et al. "High-Mobility Holes in Dual-Gated WSe2 Field-Effect Transistors ", ACS Nano, 2015, 9(10), 10402-10410, link to article:http://pubs.acs.org/doi/abs/10.1021/acsnano.5b04611?journalCode=ancac3
2. B. Fallahazad et al. "Shubnikov-de Haas Oscillations of High-Mobility Holes in Monolayer and Bilayer WSe2: Landau Level Degeneracy, Effective Mass, and Negative Compressibility", Phys. Rev. Lett. 116, 086601 (2016), (also available on arxiv.org/pdf/1602.01073.pdf) link to article:http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.116.086601
3. R. Bertoni et al. "Generation and Evolution of Spin-, Valley-, and Layer-Polarized Excited Carriers in Inversion-Symmetric WSe2", Phys. Rev. Lett. 117, 277201 (2016), (also available on arxiv.org/abs/1606.03218) link to article:http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.117.277201
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