Crystal size | ~10 mm |
Electrical properties | Topological Insulator |
Crystal structure | Hexagonal |
Unit cell parameters | a = b = 0.438 nm, c = 3.050 nm, α = β = 90°, γ = 120° |
Type | Synthetic |
Purity | >99.995% |
Characterized by | XRD, Raman, EDX, Hall measurement |
More information? | Please contact us by email or phone |
XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Stoichiometric analysis
Raman: 785nm Raman system
Hall measurement: Extraction of charge carrier density and doping in the Van der Pauw geometry.
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XRD of a single crystal Bi2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
EDX of a single crystal Bi2Te3.
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