Crystal size | ~10 mm |
Electrical properties | Metal, Charge density waves (CDW) system below ~75K, Superconductor with Tc ~1K |
Crystal structure | Hexagonal |
Unit cell parameters | a = b = 0.331 nm, c = 1.207 nm, α = β = 90, γ = 120° |
Type | Synthetic |
Purity | >99.995 % |
Characterized by | XRD, Raman, EDX |
More information? | Please contact us by email or phone |
XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Energy-dispersive X-ray spectroscopy for stoichiometric analysis
Raman: 785 nm Raman system
Click on an image to zoom
X-ray diffraction on a 2H phase Tantalum Disulfide single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8
Powder X-ray diffraction (XRD) of a single crystal 2H-TaS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal 2H-TaS2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal 2H-TaS2. Measurement was performed with a 785 nm Raman system at room temperature.
1. M. Abdel-Hafiez et al.,"Enhancement of superconductivity under pressure and the magnetic phase diagram of tantalum disulfide single crystals", Nature/Scientific Reports 6, 31824 (2016), link to article:
http://www.nature.com/articles/srep31824
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