Crystal size | ~8 mm |
Electrical properties | Semimetal, Charge density waves system (CDW, ~63K), Superconductor (Tc ~2K) |
Crystal structure | Monoclinic P |
Unit cell parameters | a = 0.5864 nm, b = 0.3918 nm, c = 1.009 nm, α = γ = 90°, γ = 98.00° |
Type | Synthetic |
Purity | >99.995 % |
Characterized by | XRD, Raman, EDX |
More information? | Please contact us by email or phone |
XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Energy-dispersive X-ray spectroscopy for stoichiometric analysis
Raman: 785 nm Raman system
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X-ray diffraction on a ZrTe3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 3, 4, 5, 6, 7, 8
Powder X-ray diffraction (XRD) of a single crystal ZrTe3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal ZrTe3 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal ZrTe3. Measurement was performed with a 785 nm Raman system at room temperature.
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